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Journal articles
Magazine articles
Open Access
Influence of pallet pattern on top-to-bottom compression performance of unitized loads, TAPPI Journal

ABSTRACT: Environmental scaling factors estimate a corrugated container’s ability to withstand various conditions it will encounter during the storage and distribution process. In this project, we examined the compressive resistance of unitized loads using differing pallet stacking patterns. To simulate real-world failure scenarios in our laboratory tests, we used two different nominal board grades of single-wall C-flute regular slotted containers loaded with a plywood panel and bagged salt to direct the failure location to the bottom of the stack. Our results showed that the columnar aligned pattern provided the greatest compressive resistance and the interlocked stacking arrangement yielded the lowest of the patterns evaluated. Based on the study results, we calculated box compression retention multipliers for each pattern and compared them to scaling factors published by the Fibre Box Association.

Magazine articles
The Role of EPC/RFID in Packaging, Solutions!, November 2005, Vol. 88(11) (244 KB)

The Role of EPC/RFID in Packaging, Solutions!, November 2005, Vol. 88(11) (244 KB)

Magazine articles
EPC and RFID to revolutionize corrugated packaging, Solutions!, November 2004, Vol. 87(11) (141KB)

EPC and RFID to revolutionize corrugated packaging, Solutions!, November 2004, Vol. 87(11) (141KB)

Magazine articles
The value of biannual corrugated engineering audits, Solutions!, August 2003, Vol. 86(8) (592KB)

The value of biannual corrugated engineering audits, Solutions!, August 2003, Vol. 86(8) (592KB)

Magazine articles
Open Access
The role of the production manager, TAPPI JOURNAL, November 1996, Vol. 79(11)

The role of the production manager, TAPPI JOURNAL, November 1996, Vol. 79(11)

Magazine articles
Open Access
A sneak preview of the box plant of the year 2000, TAPPI JOURNAL, October 1992, Vol. 75(10)

A sneak preview of the box plant of the year 2000, TAPPI JOURNAL, October 1992, Vol. 75(10)